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HOW TO ANALYZE FAILURES OF SEMICONDUCTOR DEVICES NEW THIRD EDITION!
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CD ROM |
DO YOU NEED TO KNOW?
- What a good FA report should contain - What is the "safe" sequence for an analysis - How SEM and optical views are related to the curve tracer electrical characteristics - How ionic contamination can be detected - Laboratory techniques - How to use electrical measurements to reduce the analysis steps All New Third Edition! |
Price:
$195 - U.S. Delivery $225 - Outside of U.S. Orders must be prepaid (Quantity discounts available)
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Click image to enlarge |
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Services / Company Profile / Links Directory / Search Site / Partner Products / News / Parts List
IC Microanalysis LLC - 17631 North 6th Street - Phoenix, AZ 85022 - Phone: 602-828-2606 Email: info@icmicroanalysis.com
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