Mr. David York has broad-based experience and has developed an extensive list of accomplishments in a wide variety of areas over the past 29 years. A detailed list organized into major categories is provided below.
PREVIOUS EXPERIENCE
Intellectual Property - IC Microanalysis LLC
- Traveled to various out-of-state and out-of-country
sites to review, sort, and collect archived material for prior art
research
- Coordinated and supervised analysis at out-of-state
laboratory documenting invention feature
- Directed, supervised, and assisted with physical
teardown analysis at local laboratory facility
- Reviewed, categorized, and researched large number of
patents to support patent mining projects
- Performed technical and patent prior art search for
support infringement and due diligence
- Reviewed patents, and conducted technical/market
research to support patent infringement action
- Provided technical input to support laboratory analysis
of specific physical feature
- Performed research to locate potential licensing or infringement opportunities (product/users)
- Evaluated patents and summarized unique technical
aspects of patented invention
- Formulated opinion on areas of technology and likely use of invention in industry
- Proofread and edited portions of translated patent
applications
- Extracted keywords/phrases from patent claims for prior art search or claim chart formulation
- Performed prior art searches of products, patents, and technical literature to invalidate patents
- Analyzed patent claims in relation to products and prior art.
Arbitration
- Selected to serve as a technical expert on a three-person arbitration
panel for a commercial licensing and patent dispute managed by the American
Arbitration Association.
- Reviewed patents and claims, pre- and post-trial expert reports,
depositions, technical evidence, declarations, patent file wrapper, and
supporting legal decisions.
- Heard oral arguments and testimony at hearings, reviewed motions, and
provided impartial analysis and decisions on discovery disputes, claim construction, validity, infringement, contract interpretation, and applications for costs and fees.
Litigation and Infringement:
- Performed prior art searches of
products, patents, and technical literature to provide evidence of obviousness.
- Independently analyzed patent
claims in relation to products and prior art.
- Traveled to various
out-of-state and international locations to review, sort, and collect archived
material for prior art research.
Patent Licensing and Technology Investment Research
- Provided technical review of large
patent portfolios to identify and classify technical strength of inventive
elements based on past, current, or suspected future technologies and
fabrication processes.
- Performed technical research to
identify potential licensing opportunities for inventions.
- Performed technical review of
individual patents to identify general inventive features, and specific
inventive claimed elements.
IP and Engineering - (prior to IC Microanalysis)
- Multi-tasked by performing
hands-on physical analysis of actual products, while also
serving as Manager and Vice President of analytical groups.
- Developed new analytical techniques
and chemical stains to allow for continued high-quality analysis as
semiconductor technologies evolved over 20 years.
- Served as Manager and Vice
President of Laboratory Services Group, supervised staff of 12 engineers and
technicians.
- Developed and served as Vice President
of IP Analysis Services Group.
- Assisted with marketing and sales
of laboratory services and reports.
- Served as primary client contact for all
laboratory and patent analysis.
- Prepared ISO 9000 documentation
and equipment operation manuals.
- Coordinated
and prepared development of Laboratory Manual outlining processes and procedures.
- Performed technical review of
Japanese translated technical documents and patent applications.
- Served as instructor for
Laboratory Analysis portion of Failure Analysis Seminar.
- Assisted with development of on-site hands-on laboratory analysis class.
- Performed physical and materials
analysis, and documentation of specific patented inventions identified from
review of patents in portfolio.
- Provided specific technical
analysis on client-supplied products to support technology database that was
used for identifying current and future products and manufacturers for possible
licensing and infringement opportunities.
- Performed parts search to locate
specific older or recent semiconductor products manufactured by defendants
within specific product data codes.
- Provided physical and materials analysis and
documentation of evidence to indicate presence of a specific physical design
layout, manufacturing process, or device structural feature for claimed and
patented invention.
- Reviewed and interpreted
semiconductor device cross-sectional images for comparison to claimed patent
elements.
- Gave deposition testimony on
three separate cases to support analytical laboratory results.
- Performed physical and materials
analysis to document evidence that refuted presence of a specific
physical design layout, manufacturing process, or device structural feature for
claimed and patented invention.
- Provided physical and materials
analysis and documentation of patented feature on plaintiffs’ parts to
strengthen defendants negotiating position.
Competitive Analysis
- Performed physical and materials
analysis to document general assembly and die fabrication process, physical layout
features, device (transistor) structures and designs.
- Performed physical analysis to
document individual transistor and circuit interconnects layers associated with
circuit layout and extracted circuit schematic at the transistor level,
converted to basic functional logic levels.
- Performed physical and materials
analysis of state-of-the art devices to document and compare process and design
features, and technology levels.
- Prepared postulated process
sequences from results of analysis.
Construction Quality Analysis
- Performed physical and materials
analysis to document package and assembly quality, general process and layout quality
and compare to physical standards as defined in quality standards outlined in Mil.
Std 883, such as metal step coverage, overlay passivation integrity, etc.
Identified and assess suspect process features in relation to short or
long-term reliability of product in field.
Physical Failure Analysis
- Performed limited (pin-to-pin) electrical,
liquid crystal, and detailed physical and materials analysis to locate suspect
physical failure sites.