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IC Microanalysis


 


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NEW!

FREE SEMICONDUCTOR GLOSSARY

A B C D E F G H I J K L M

N O P Q R S T U V W X Y Z

 

Partner Products

Physics of Semiconductor Failures

How To Analyze Failures of Semiconductor Devices

The Semiconductor Picture Dictionary

Semiconductor Reliability News

REL-IND - Electronic Reliability Projection Software

New Sixth Edition!

(CD-ROM)

All New Third Edition!

(CD-ROM)

Published since 1989!

All New Third Edition!

(CDROM)


THE SEMICONDUCTOR PICTURE DICTIONARY

NEW THIRD EDITION!

Semiconductor Picture Dictionary

CD ROM

 

  DO YOU NEED TO KNOW?

 

- What is bambooing

- What is a flag

- What does purple plague look like

- What is ESD vs EOS

- What is a bond tail or a bond heel

- Amorphous silicon vs polysilicon

- What does an intermetallic look like

- Junction vs ambient temperature

All New Third Edition!

 

Price:

 

$195 - U.S. Delivery

$225 - Outside of U.S.

Orders must be prepaid

(Quantity discounts available)

 

Order Form

 

 


Highlights

  • Hundreds of screens of key words and phrases in alphabetical order
  • Each page has one or more color and/or SEM photos or drawing
  • Material is designed for anyone in the industry
  • Word find and print commands
  • Covers from AZ to Zener
  • A must for pre-cap inspectors

Contents

On each page, you get:

  • Word
  • Word Category
  • Other Terms
  • Definition

Image provided by DM Data

Click image to enlarge

 

IC Microanalysis LLC - 17631 North 6th Street  - Phoenix, AZ  85022 -  Phone: 602-828-2606

Email: info@icmicroanalysis.com

 

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