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IC Microanalysis


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Structural and Construction Analysis Report Expert

Prior to establishing IC Microanalysis LLC, Mr. York served in various positions in the Laboratory Services Group at Integrated Circuit Engineering Corporation (ICE Corporation) and Chipworks USA.

During that time, his responsibilities included hands-on laboratory analysis, proofreading/editing, and directing a team of engineers in completion of thousands of semiconductor structural and construction analysis reports back to 1979. Many of these reports were publicly available, and have been utilized in patent litigation cases and cited as prior art references in patents.

Mr. York played a critical role in producing these reports, making him a uniquely-qualified expert resource for technical, analytical, or image interpretation questions related to their content.

Contact Mr. York for assistance.

Prior Art References

To date, technology analysis reports written by Mr. York or under his direction have been cited as prior art in the following US patents:

 

7,078,303

5,874,327

5,650,666

6,953,732

5,846,874

5,545,574

5,962,926

5,843,809

5,514,616

5,898,213

5,662,768


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IC Microanalysis LLC - 17631 North 6th Street  - Phoenix, AZ  85022  -  Phone: 602-828-2606  -  Fax: 602-324-0826

Email: info@icmicroanalysis.com  Comments or questions about the site: Webmaster

 

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