Structural and Construction Analysis Report Expert

Prior to establishing IC Microanalysis LLC, Mr. York served in various positions in the Laboratory Services Group at Integrated Circuit Engineering Corporation (ICE Corporation) and Chipworks USA.

During that time, his responsibilities included hands-on laboratory analysis, proofreading/editing, and directing a team of engineers in completion of thousands of semiconductor structural and construction analysis reports back to 1979. Many of these reports were publicly available, and have been utilized in patent litigation cases and cited as prior art references in patents.

Mr. York played a critical role in producing these reports, making him a uniquely-qualified expert resource for technical, analytical, or image interpretation questions related to their content.